Sample Preparation Matters

Welcome to Datech Scientific Ltd, your trusted Laboratory Partner since 1989 for premium sample preparation equipment and laboratory automation solutions. We specialize in equipping laboratories with state-of-the-art instruments to support X-ray Fluorescence (XRF), X-ray Diffraction (XRD), Optical Emission Spectroscopy (OES), Induced Coupled Plasma (ICP) analyses, and more, through our esteemed partnerships with Herzog Maschinenfabrik, PD Instruments, Nucomat, and other innovators in the Laboratory environment.

http://www.datech-scientific.co.uk/analysis/icp-oes/

ICP (Inductively Coupled Plasma) Analysis

ICP (Inductively Coupled Plasma) analysis provides fast identification and detection of trace metals content in chemical and petroleum samples. ICP instruments are often combined with mass spectrometry (ICP-MS) for achieving even lower levels of detection and measurement of trace and ultra-trace metals. Trace metals detected and measured by ICP and ICP-MS:

  • Aluminium, Arsenic, Boron, Barium, Beryllium, Bismuth

  • Calcium, Cadmium, Cerium, Cobalt, Chromium, Cesium, Copper

  • Dysprosium, Erbium, Europium, Gold, Gallium, Germanium

  • Iron, Iodine, Indium, Iridium, Lead, Lithium

  • Mercury, Magnesium, Manganese, Molybdenum

  • Sodium, Nickel, Potassium, Phosphorus, Palladium, Platinum

  • Rubidium, Rhenium, Rhodium, Ruthenium

  • Silver, Sulphur, Antimony, Scandium, Selenium, Silicon

  • Tin, Tantalum, Thorium, Titanium ,Thallium

  • Vanadium, Tungsten, Yttrium, Ytterbium, Zinc

  • And other metals and metal species

Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES Analysis) ICP-OES is a trace-level, elemental analysis technique that uses the emission spectra of a sample to identify, and quantify the elements present. Samples are introduced into the plasma in a process that desolates, ionises, and excites them. The constituent elements can be identified by their characteristic emission lines, and quantified by the intensity of the same lines.

  • High sample throughput enabling the efficient analysis of large batches

  • Simultaneous determination of multiple elements in each sample

  • Complementary analysis to techniques like XRF

  • Large dynamic linear range

  • Low chemical and matrix interference effectsTypical Applications

  • Trace analysis of environmental soil and water samples

  • Assessment of metal ores for mass balances and process control

  • Trace metal analysis of any material that can be digested into an aqueous matrix

  • Boron and Lithia in glasses

  • Forensic analysis

  • Trace analysis of food and drink samples such as; metals in wine; and elements bound to proteins

    Metal release testing of tableware

Typical Industries using ICP-OES

  • Environmental testing

  • Food and drinks

  • Materials

  • Minerals

  • Glass, ceramics and refractories

  • Healthcare

X-Ray Diffraction (XRD)

Note: X-Ray Diffraction is used to determine crystallographic structure, chemical composition, and physical properties of materials and thin films. The techniques above are used for qualitative or quantitative elemental analysis.

Sample Excitation Source

Primary X-Rays

Sample Material & Preparation Method

Metallic & Non-Metallic Solids, Liquids and Powders. Little careful preparation since sample material is used to identify crystalline structure.

Form of Prepared Sample

Powders & Films

Typical Industry

Metals & Alloys Production, Non-Metallic Materials Production, Education and Environmental Testing

Advantages

Sample Type and Quality Versatility. Documented Sample Preparation Methods. Analyse Crystalline Structure

Disadvantages

N/A - No other immediately comparable technique

Sample Preparation Equipment

Crushing

Course Crushing and Pre-Crushing of Sample Material

Fusion

Ideal for Preparation of Samples with Inconsistent Matrices for Fused Bead XRF, ICP, AA and Other Analyses

Benchtop Preparation

Perfect for laboratories with space constraints seeking high quality, cost effective equipment with low maintenance requirements.

Pulverising / Grinding

Fine Grinding / Pulverising of Sample Material to Guarantee Homogeneity

Milling / Grinding

Ideal for Solid Alloy Samples to Prevent Contamination and Remove Defects for OES, XRF and Other Analyses

Pressing

Pressing of Sample Material for X-ray Fluorescence, X-ray Diffraction and Other Analyses

Wet Chemistry

Requires a variety of liquid handling, dosing, digestion, inspection and analyses techniques

Standalone Semi-Automatic Preparation

Purpose Built for Industrial Laboratories with rapid cycle times, reduced operator interaction and dwell time maximising throughput and precision.

Standard & Bespoke Automatic Laboratory

Designed to tackle the most repetitive and challenging laboratory applications 24-7-365, fully automatic preparation is the future for process laboratories.

Why Choose Datech Scientific Limited?

At Datech Scientific Limited, we're not just about providing equipment; we're about delivering solutions that drive success. With our cutting-edge technology, tailored solutions, and a commitment to excellence, we ensure your laboratory or industrial processes are efficient, reliable, and above all, accurate and precise.

Why settle for less when you can partner with a leader in scientific innovation?

  • Expertise in Sample Handling and Preparation: Our deep understanding ensures you get accurate results every time.

  • Tailored Solutions: From industrial to laboratory scale, we have standard and customisable solutions to meet your specific needs.

  • Quality Equipment: Embrace reliability with our selection of effective sample preparation equipment.

  • Ongoing Support: Enjoy comprehensive support from our team. We are dedicated to your success as you will become a customer for life.

Don't let your analysis be anything less than exceptional. Choose Datech Scientific Limited for sample preparation solutions. Contact us today to elevate your operations to the next level.

Become a Valued Customer and Partner